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X-LIC-LOCATION:America/New_York
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TZOFFSETFROM:-0500
TZOFFSETTO:-0400
TZNAME:EDT
DTSTART:19700308T020000
RRULE:FREQ=YEARLY;BYMONTH=3;BYDAY=2SU
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UID:event-163307@it-news-and-events.info
DTSTAMP:20260625T152106Z
DTSTART;TZID=America/New_York:20250912T130000
DTEND;TZID=America/New_York:20250912T140000
SUMMARY:Reduce Your Risk of Data Loss! 'Critical Testing Insights for Devel
 opers'
DESCRIPTION:Thursday\, September 25th\, 2025: 1:00 PM to 2:00 PM\n\nIn toda
 y's data-driven world\, ensuring the resilience of your storage systems is
  critical for long-term success. This vendor-neutral webinar\, hosted by t
 he STA\, will bring together industry experts to explore proven methodolog
 ies for testing the robustness of Serial Attached SCSI (SAS) and other dat
 a storage infrastructures.\n\nhttps://cms.it-news-and-events.info/html/bac
 k-issues/?article=163307
URL:https://cms.it-news-and-events.info/html/back-issues/?article=163307
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